High-resolution micro-CT as a tool for 3D surface roughness measurement of 3D additive manufactured porous structures

Kerckhofs, Greet;Pyka, Grzegorz;Moesen, Maarten;Schrooten, Jan;Wevers, Martine
(2012) ICT 2012, International Conference on Industrial Computed Tomography — Location: Wels, Austria (19.September.2012)

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Kerckhofs, G., Pyka, G., Moesen, M., Schrooten, J., & Wevers, M. (2012). High-resolution micro-CT as a tool for 3D surface roughness measurement of 3D additive manufactured porous structures. ICT 2012, International Conference on Industrial Computed Tomography, Wels, Austria. https://hdl.handle.net/2078.5/236658