Partially depleted SOI dynamic threshold MOSFET for low-voltage and microwave applications

Dehan, Morin;Vanhoenacker-Janvier, Danielle;Raskin, Jean-Pierre
(2003) 203rd Meeting of the Electrochemical Society – 11th Int. Symp. on SOI technology and devices — Location: Paris, France (27.April.2003)

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Dehan, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2003). Partially depleted SOI dynamic threshold MOSFET for low-voltage and microwave applications. Proceedings of the 203rd Meeting of the Electrochemical Society – 11th Int. Symp. on SOI technology and devices, pp. 289-294. https://hdl.handle.net/2078.5/229280