Single event upset tests of an 80-Mbit/s optical receiver
(2000) IEEE Transactions on Nuclear Science — Vol. 48, n° 5, p. 1700-1707 (2001)
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Faccio, F., Gill, K., Huhtinen, M., Marchioro, A., Moreira, P., Vasey, F., & Berger, G. (2000). Single event upset tests of an 80-Mbit/s optical receiver. IEEE Transactions on Nuclear Science, 48(5), 1700-1707. https://doi.org/10.1109/23.960360 (Original work published 2001)