Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins
(2011) Advanced Materials — Vol. 23, n° 18, p. 2119-2122 (2011)
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- Abstract
- Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.
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Citations
Idrissi, H., Wang, B., Colla, M.-S., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2011). Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins. Advanced Materials, 23(18), 2119-2122. https://doi.org/10.1002/adma.201004160 (Original work published 2011)