Stress relaxation in Al-Si-Cu thin films and lines
(1995) the Materials Research Society Symposium — Location: Boston - MA (1995)
Files
No attached file found for this publication.
Details
- Authors
- Affiliations
Citations
Witvrouw, A., Proost, J., Deweerdt, B., Roussel, Ph., & Maex, K. (1995). Stress relaxation in Al-Si-Cu thin films and lines. Proceedings, p. 441. https://hdl.handle.net/2078.5/229678