Charge dissipation in antistatic felts: an atomic force microscopy studyYin, Jun;Nysten, Bernard(2010) 18th International Vacuum Congress - IVC18 — Location: Beijing, China (23.August.2010)
FilesNo attached file found for this publication.DetailsAuthorsYin, JunUCLouvainAuthorNysten, BernardUCLouvainAuthorAffiliationsUCLouvainSST/IMCN/BSMA - Bio and soft matterShow moreCitations APA Chicago FWB Yin, J., & Nysten, B. (2010). Charge dissipation in antistatic felts: an atomic force microscopy study. 18th International Vacuum Congress - IVC18, Beijing, China. https://hdl.handle.net/2078.5/226279