Invited Talk : Atomic Force Microscopy : a Powerful Tool for Probing the Microbial Cell SurfaceDufrêne, Yves(2002) 224th ACS National Meeting — Location: Boston, USA (18.August.2002)
FilesNo attached file found for this publication.DetailsAuthorsDufrêne, YvesUCLouvainAuthorAffiliationsUCLouvainAGRO/CABI - Département de chimie appliquée et des bio-industriesShow moreCitations APA Chicago FWB Dufrêne, Y. (2002). Invited Talk : Atomic Force Microscopy : a Powerful Tool for Probing the Microbial Cell Surface. 224th ACS National Meeting, Boston, USA. https://hdl.handle.net/2078.5/221931