Recognition imaging using atomic force microscopy.

Ebner, A.;Chtcheglova, L.;Tang, J.;Alsteens, David;Hinterdorfer, P.;et.al.
(2009) Handbook of Single-Molecule Biophysics — ISBN: [978-0-387-76497-9], p. 525-554, published

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Authors
  • Ebner, A.Johannes Kepler University of Linz, Linz, Austria
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  • Chtcheglova, L.Johannes Kepler University of Linz, Linz, Austria
    Author
  • Tang, J.Johannes Kepler University of Linz, Linz, Austria
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  • Dupres, VincentUCLouvain
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  • Hinterdorfer, P.Institute for Biophysics of Linz, Linz, Austria
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Abstract
The nanoscale exploration of microbes using atomic force microscopy (AFM) is an exciting research field that has expanded rapidly in the past years. Using AFM topographic imaging, investigators can visualize the surface structure of live cells under physiological conditions and with unprecedented resolution. In doing so, the effect of drugs and chemicals on the fine cell surface architecture can be monitored. Real-time imaging offers a means to follow dynamic events such as cell growth and division. In parallel, chemical force microscopy (CFM), in which AFM tips aremodified with specific functional groups, allows researchers to measure interaction forces, such as hydrophobic forces, and to resolve nanoscale chemical heterogeneities on cells, on a scale of only ∼25 functional groups. Lastly, molecular recognition imaging using spatially resolved force spectroscopy, dynamic recognition imaging or immunogold detection, enables microscopists to localize specific receptors, such as cell adhesion proteins or antibiotic binding sites. These noninvasive nanoscale analyses provide new avenues in pathogenesis research, particularly for investigating the action mode of antimicrobial drugs, and for elucidating the molecular basis of pathogen–host interactions.
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Citations

Ebner, A., Chtcheglova, L., Tang, J., Alsteens, D., Dupres, V., Dufrêne, Y., & Hinterdorfer, P. (2009). Recognition imaging using atomic force microscopy. In P. Hinterdorfer, A. van Oijen (ed.), Handbook of Single-Molecule Biophysics (p. p. 525-554). Springer-Verlag, ch. 18,. https://hdl.handle.net/2078.5/50969