A Multitechnique Analysis of the Outermost Layers of the Teflon Pfa Surface

Piyakis, K.;Sacher, E.;Domingue, A.;Pireaux, Jean-Jacques;Lhoest, JB.;et.al.
(1995) Applied Surface Science — Vol. 84, n° 3, p. 227-235 (1995)

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Authors
  • Piyakis, K.
    Author
  • Sacher, E.
    Author
  • Domingue, A.
    Author
  • Pireaux, Jean-JacquesUnamur
    Author
  • Bertrand, PatrickUCLouvain
    Author
  • Lhoest, JB.
    Author
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Abstract
Fluoropolymers are notoriously difficult to metallize. In order to ascertain the role of the substrate surface, the surface chemical structure of a representative fluoropolymer has been determined. Three techniques have been used to study the outer surfaces of the extruded fluoropolymer film, Teflon PFA. These techniques are: high-resolution electron energy-loss spectroscopy, phase-sensitive photoacoustic Fourier-transform infrared spectroscopy and time-of-flight secondary ion mass spectroscopy. These complementary techniques confirm that the extrusion process introduces a small amount of outer surface contamination, probably through the reaction of the hot extrudate with the atmosphere immediately on exiting the film-forming die.
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Citations

Piyakis, K., Sacher, E., Domingue, A., Pireaux, J.-J., Leclerc, G., Bertrand, P., & Lhoest, JB. (1995). A Multitechnique Analysis of the Outermost Layers of the Teflon Pfa Surface. Applied Surface Science, 84(3), 227-235. https://doi.org/10.1016/0169-4332(94)00551-6 (Original work published 1995)