Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity

Chizhik, S.A.; Proost, Joris; Matvienko, A.A.; Sidelnikov, A.A.

doi:10.1063/1.1287760

Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity

Chizhik, S.A.

;

Proost, Joris

;

Matvienko, A.A.

;

Sidelnikov, A.A.

(2000) Journal of Applied Physics — Vol. 88, n° 6, p. 3301 (2000)

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Authors

Chizhik, S.A.
Author
Proost, JorisUCLouvain
Author
Matvienko, A.A.
Author
Sidelnikov, A.A.
Author

Affiliations

UCLouvain

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Chizhik, S. A., Proost, J., Matvienko, A. A., & Sidelnikov, A. A. (2000). Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity. Journal of Applied Physics, 88(6), 3301. https://doi.org/10.1063/1.1287760 (Original work published 2000)