Electrical Measurements On Submicronic Synthetic Conductors - Carbon Nanotubes
(2004) Synthetic Metals — Vol. 70, n° 1-3, p. 1393-1396 (2004)
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- Abstract
- The synthesis of very small samples has raised the need for a drastic miniaturization of the classical four-probe technique in order to realize electrical resistance measurements. Two methods to realize electrical contacts on very small fibers are described here. Using classical photolithography the electrical resistivity of a submicronic catalytic chemical vapour deposited filament is estimated. Scanning tunneling microscopy (STM) lithography allowed to attach small gold contacts to a small bundle (diameter 50 nm) of carbon nanotubes. This bundle is found to exhibit a semimetallic behavior at higher temperature and an unexpected drop of the electrical resistivity at lower temperature.
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Citations
Langer, L., Stockman, L., Heremans, JP., Bayot, V., Olk, CH., Vanhaesendonck, C., Bruynseraede, Y., & Issi, JP. (2004). Electrical Measurements On Submicronic Synthetic Conductors - Carbon Nanotubes. Synthetic Metals, 70(1-3), 1393-1396. https://doi.org/10.1016/0379-6779(94)02893-4 (Original work published 2004)