Coulomb blockade and negative differential conductance in metallic double-dot devicesNguyen, Viet-Hung;et al.(2004) Journal of Applied Physics — Vol. 96, n° 6, p. 3302-3306 (2004)
FilesNguyenJAP2004.pdf Open Access Adobe PDF126.5 KBDownloadDetailsAuthorsNguyen, Viet-HungUCLouvainAuthoret al.AuthorAffiliationsInstitute of Physics, VASTShow moreCitations APA Chicago FWB Nguyen, V.-H., & et al. (2004). Coulomb blockade and negative differential conductance in metallic double-dot devices. Journal of Applied Physics, 96(6), 3302-3306. https://doi.org/10.1063/1.1782954 (Original work published 2004)