Directional wavelets revisited: Cauchy wavelets and symmetry detection in patterns

Antoine, Jean-Pierre;Murenzi, R.;Vandergheynst, Pierre
(1999) Applied and Computational Harmonic Analysis — Vol. 6, n° 3, p. 314-345 (1999)

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Authors
  • Antoine, Jean-Pierreorcid-logoUCLouvain
    Author
  • Murenzi, R.
    Author
  • Vandergheynst, PierreUCLouvain
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Abstract
The analysis of oriented features in images requires two-dimensional directional wavelets. Among these, we study in detail the class of Cauchy wavelets, which are strictly supported in a (narrow) convex cone in spatial frequency space. They have excellent angular selectivity, as shown by a standard calibration test, and they have minimal uncertainty. In addition, we present a new application of directional wavelets, namely a technique for determining the symmetries of a given pattern with respect to rotations and dilation. (C) 1999 Academic Press.
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Citations

Antoine, J.-P., Murenzi, R., & Vandergheynst, P. (1999). Directional wavelets revisited: Cauchy wavelets and symmetry detection in patterns. Applied and Computational Harmonic Analysis, 6(3), 314-345. https://doi.org/10.1006/acha.1998.0255 (Original work published 1999)