Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET
(2022) International Microwave Symposium - IMS 2022 — Location: Denver, Colorado, USA (12.June.2022)
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Vanbrabant, M., Nyssens, L., Kilchytska, V., & Raskin, J.-P. (2022). Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET. International Microwave Symposium - IMS 2022, Denver, Colorado, USA. https://hdl.handle.net/2078.5/229477