Certifying the degree of perfection of silicon single crystals for the Avogadro project by measuring the amount of copper silicide precipitated in the voids
(2004) Conference on Precision Electromagnetic Measurements (CPEM) — Location: London
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Spaepen, F., Wen, C. Y., Proost, J., Quétel, C., Aninkevicius, V., Taylor, P. D. P., & De Bièvre, P. (2004). Certifying the degree of perfection of silicon single crystals for the Avogadro project by measuring the amount of copper silicide precipitated in the voids. Conference on Precision Electromagnetic Measurements (CPEM), London. https://hdl.handle.net/2078.5/230845