Polymer surfaces studied by ToF-SIMS : (time-of-flight secondary ion mass spectrometry), molecular weight effects and quantification

Vanden Eynde, Xavier

Polymer surfaces studied by ToF-SIMS : (time-of-flight secondary ion mass spectrometry), molecular weight effects and quantification

Vanden Eynde, Xavier

(1999)

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Authors

Vanden Eynde, XavierUCLouvain
author

Supervisors

Bertrand, Patrick

Affiliations

UCLouvainFSA/MAPR - Département des sciences des matériaux et des procédés

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Vanden Eynde, X. (1999). Polymer surfaces studied by ToF-SIMS : (time-of-flight secondary ion mass spectrometry), molecular weight effects and quantification. https://hdl.handle.net/2078.5/94695