Angular dependence of the scattered ion yields in /sup 4/He /sup +/ rarr Cu scattering spectrometry

Bertrand, Patrick;Delannay, Francis;Bulens, C.;Streydio, Jean-Marie
(1977) Surface Science — Vol. 68, p. 108-117 (1977)

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  • Bertrand, PatrickUCLouvain
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  • Delannay, Francisorcid-logoUCLouvain
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  • Bulens, C.
    Author
  • Streydio, Jean-MarieUCLouvain
    Author
Abstract
Assuming long range charge exchange mechanisms and neglecting shadowing effects, theory predicts the variation of the scattered ion yield with the scattering angle thetas and the incidence angle psi for some well defined experimental conditions. Such measurements were performed for /sup 4/He/sup +/ scattering on polycrystalline copper at incident energies ranging from 0.5 to 1.25 keV and at scattering angles from 20 degrees to 130 degrees . It is suggested that shadowing effects should be taken into account in order to explain the observed behaviour.
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Bertrand, P., Delannay, F., Bulens, C., & Streydio, J.-M. (1977). Angular dependence of the scattered ion yields in /sup 4/He /sup +/ rarr Cu scattering spectrometry. Surface Science, 68, 108-117. https://hdl.handle.net/2078.5/148107 (Original work published 1977)