New on-chip testing method for ultra thin metallic films

Iker, François;André, Nicolas;Pardoen, Thomas;Raskin, Jean-Pierre
(2005) Euromech Colloquium 463 - Size dependent mechanics of materials — Location: Groningen, The Netherlands (13.June.2005)

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Iker, F., André, N., Pardoen, T., & Raskin, J.-P. (2005). New on-chip testing method for ultra thin metallic films. Proceedings of the Euromech Colloquium 463 - Size dependent mechanics of materials, p. Poster 5. https://hdl.handle.net/2078.5/272260