Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structuresKerckhofs, Greet;Pyka, Grzegorz;Velasco Martin, Enrique;Moesen, Maarten;Wevers, Martine;et.al.(2010) Cellular Materials (CellMat) 2010 — Location: Dresden, Germany (25.October.2010)
FilesNo attached file found for this publication.DetailsAuthorsKerckhofs, GreetUCLouvainAuthorPyka, GrzegorzAuthorVelasco Martin, EnriqueAuthorMoesen, MaartenAuthorWevers, MartineAuthorShow more AffiliationsKULKULShow moreCitations APA Chicago FWB Kerckhofs, G., Pyka, G., Velasco Martin, E., Moesen, M., Schrooten, J., & Wevers, M. (2010). Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structures. Cellular Materials (CellMat) 2010, Dresden, Germany. https://hdl.handle.net/2078.5/236685