Deph profiling on Ta2O5 thin layer on Ta foil by ion scattering spectrometry
(1988) Materials Modifications by High-fluence Ion Beams — ISBN: [0-7923-0035-1], p. 101-109, published
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Rummens, F., Bertrand, P., & De Puydt, Y. (1988). Deph profiling on Ta2O5 thin layer on Ta foil by ion scattering spectrometry. In R. Kelly and M. Fernanda da Silva (ed.), Materials Modifications by High-fluence Ion Beams (p. p. 101-109). Kluwer Academic Publishers. https://hdl.handle.net/2078.5/153590