Structure and Low-temperature Thermal-conductivity of Pyrolytic Boron-nitride
(1992) Physical Review. B, Condensed Matter — Vol. 46, n° 6, p. 3362-3367 (1992)
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- The microstructure and morphology of three samples of pyrolytic boron nitride deposited at different temperatures have been characterized with use of x-ray diffraction and thermal-conductivity measurements. The x-ray analysis allowed the determination of the mean interlayer spacing, the out-of-plane coherence length, and the crystallites preferred orientation. It revealed the presence of three distinct morphologies. The thermal conductivity was measured as a function of temperature in the range 1. 5 < T < 300 K. The temperature variations of the thermal conductivity were fitted by using a model previously developed for the analysis of the thermal conductivity of graphites and carbons. This fit allowed the determination of the in-plane coherence length. It also allowed the analysis of point-defect concentration and of the interlayer shear modulus. It is shown that low-temperature thermal-conductivity measurements may be used to complement x-ray diffraction data for the microstructural characterization of materials.
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Duclaux, L., Nysten, B., Issi, J.-P., & Moore, A. W. (1992). Structure and Low-temperature Thermal-conductivity of Pyrolytic Boron-nitride. Physical Review. B, Condensed Matter, 46(6), 3362-3367. https://doi.org/10.1103/PhysRevB.46.3362 (Original work published 1992)