Ellipsometric porosimetry studies of amorphous alumina thin filmsProost, Joris;Spaepen, F.(2004) Invited contribution to the Gordon Research Conference on Solid State Studies in Ceramics — Location: Meriden, NH (July.2004)
FilesNo attached file found for this publication.DetailsAuthorsProost, JorisUCLouvainAuthorSpaepen, F.AuthorAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésShow moreCitations APA Chicago FWB Proost, J., & Spaepen, F. (2004). Ellipsometric porosimetry studies of amorphous alumina thin films. Invited contribution to the Gordon Research Conference on Solid State Studies in Ceramics, Meriden, NH. https://hdl.handle.net/2078.5/72586