Accurate SOI MOSFET characterization at microwave frequencies
(1998) 4th Symposium Diagnostics and Yield, SOI – materials, devices and characterization — Location: Warszaw, Poland (22.April.1998)
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Raskin, J.-P., Dambrine, G., & Vanhoenacker-Janvier, D. (1998). Accurate SOI MOSFET characterization at microwave frequencies. Proceedings of the 4th Symposium Diagnostics and Yield, SOI – materials, devices and characterization, p. 2 pages. https://hdl.handle.net/2078.5/231086