High Resistivity SOI wafer: the substrate for RF SoC applications?

Raskin, Jean-Pierre
(2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Location: Kyiv, Ukraine (25.October.2010)

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Raskin, J.-P. (2010). High Resistivity SOI wafer: the substrate for RF SoC applications? Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, pp. 51-52. https://hdl.handle.net/2078.5/231180