On a chip MEMS based mechanical testingPardoen, Thomas;Raskin, Jean-Pierre;Coulombier, Michaël;Jaddi, Sahar;Idrissi, Hosni;et.al.(2018) Workshop on stress in microelectronics — Location: Leuven, Belgium (10.September.2018)
FilesNo attached file found for this publication.DetailsAuthorsPardoen, ThomasUCLouvainAuthorRaskin, Jean-PierreUCLouvainAuthorCoulombier, MichaëlUCLouvainAuthorJaddi, SaharUCLouvainAuthorIdrissi, HosniUCLouvainAuthorShow more AffiliationsUCLouvainSST/IMMC/IMAP - Materials and process engineeringUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueShow moreCitations APA Chicago FWB Pardoen, T., Raskin, J.-P., Coulombier, M., Jaddi, S., Ghidelli, M., Vayrette, R., & Idrissi, H. (2018). On a chip MEMS based mechanical testing. Workshop on stress in microelectronics, Leuven, Belgium. https://hdl.handle.net/2078.5/231920