Impact of crosstalk into high resistivity silicon substrate on the RF performance of SOI MOSFET
(2009) 8th Diagnostics & Yield Symposium — Location: Warszaw, Poland (22.June.2009)
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Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2009). Impact of crosstalk into high resistivity silicon substrate on the RF performance of SOI MOSFET. Proceedings of the 8th Diagnostics & Yield Symposium, p. Poster 2. https://hdl.handle.net/2078.5/230757