Surface and stress effects on the electrical conductivity of nano-scale siliconBhaskar, Umesh Kumar;Passi, Vikram;Pardoen, Thomas;Raskin, Jean-Pierre(2012) 2012 MRS Fall Meeting & Exhibit — Location: Boston, Massachusetts, UDA (25.November.2012)
FilesNo attached file found for this publication.DetailsAuthorsBhaskar, Umesh KumarUCLouvainAuthorPassi, VikramUCLouvainAuthorPardoen, ThomasUCLouvainAuthorRaskin, Jean-PierreUCLouvainAuthorAffiliationsUCLouvainSST/IMMC/MEMA - Applied mechanics and mathematicsUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueUCLouvainSST/IMMC/IMAP - Materials and process engineeringShow moreCitations APA Chicago FWB Bhaskar, U. K., Passi, V., Pardoen, T., & Raskin, J.-P. (2012). Surface and stress effects on the electrical conductivity of nano-scale silicon. 2012 MRS Fall Meeting & Exhibit, Boston, Massachusetts, UDA. https://hdl.handle.net/2078.5/185468