X-ray photoelectron spectroscopy study of nitrided zeolites

Srasra, Mondher;Delsarte, Stéphanie;Gaigneaux, Eric
(2010) Studies in Surface Science and Catalysis — Vol. 175, p. 831-834 (2010)

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Authors
  • Srasra, MondherUCLouvain
    Author
  • Delsarte, StéphanieUCLouvain
    Author
  • Gaigneaux, Ericorcid-logoUCLouvain
    Author
Abstract
X-ray photoelectron spectroscopy (XPS) was used to observe the changes in the nitrogen, silicon and aluminum local environments occurring upon nitridation of ultrastable Y zeolite (Si/Al = 13) at different temperatures. In the case of nitrogen an identification and quantification of incorporated species was possible. The substitution of oxygen by nitrogen in the immediate vicinity of both silicon and aluminum atoms was also demonstrated. The extent of this substitution was more important at high nitridation temperature.
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Srasra, M., Delsarte, S., & Gaigneaux, E. (2010). X-ray photoelectron spectroscopy study of nitrided zeolites. Studies in Surface Science and Catalysis, 175, 831-834. https://doi.org/10.1016/S0167-2991(10)75171-5 (Original work published 2010)