Surface-analysis of Polymers By Ionic Spectrometries - X-ray Photoelectron Spectroscopic Evaluation of Ion-bombardment Damages
(1990) ACS Symposium Series — Vol. 440, p. 210-222 (1990)
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- Polymethyl-methacrylate (PMMA) and Polyethylene terephthalate (PET) samples have been analyzed by two different ionic surface spectrometries: namely, ISS using 2 keV He ions and static SIMS using 4 kev Xe ions. The same techniques combined with XPS have been used in order to determine the ion doses leading to the lowest ion induced damages together with acceptable signal/noise ratios. It is shown that both the mass of the ion used for the analysis and the nature of the investigated polymer must be considered for the study of the ion induced damages.
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Depuydt, Y., Léonard, D., & Bertrand, P. (1990). Surface-analysis of Polymers By Ionic Spectrometries - X-ray Photoelectron Spectroscopic Evaluation of Ion-bombardment Damages. ACS Symposium Series, 440, 210-222. https://doi.org/10.1021/bk-1990-0440.ch015 (Original work published 1990)