Physicochemical Characterization of Supported Catalysts By Analytical Electron-microscopy, X-ray Photoelectron-spectroscopy and Ion-scattering Spectrometry
(1981) ACS national meetings
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- Authors
Delannay, Francis 
- Abstract
- A summary of experience is reported concerning the use of AEM (Analytical Electron Microscopy), XPS (X-ray Photoelectron Spectroscopy) and ISS (Ion Scattering Spectrometry). Although the breakthroughs of XPS for catalysis research are generally known, it appears useful to attempt a critical evaluation of its application to the characterization of supported phases. The use of AEM and ISS remains up to now less widespread but since the performances of these two methods have been increased in recent years, thanks to instrumental improvements, it seems up to date to highlight the prospects offered by these techniques. It is shown how a comprehensive knowledge of the catalyst properties cited above can be achieved by an approach involving three physico-chemical tools which complement each other.
- Affiliations
Citations
Delannay, F., & Defosse, C. (1981). Physicochemical Characterization of Supported Catalysts By Analytical Electron-microscopy, X-ray Photoelectron-spectroscopy and Ion-scattering Spectrometry. American Chemical Society. Abstracts of Papers (at the National Meeting), 181(MAR), 57-PETR. https://hdl.handle.net/2078.5/148177 (Original work published 1981)