In situ (XPS) and ex situ (XPS and ToF-SIMS) studies of the Nylon 6 and PMMA treated in remote O2 and O2-N2 plasmas
(1995) 12th International Symposium on Plasma Chemistry ISPC 12 — Location: Minneapolis MN - USA (21.August.1995)
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INST PHYS & CHIM MAT STRASBOURG,F-67037 STRASBOURG,FRANCE INST PHYS & CHIM MAT STRASBOURG,F-67037 STRASBOURG,FRANCE
Citations
Scheuer, A., Prat, R., Deville, J. P., Léonard, D., & Bertrand, P. (1995). In situ (XPS) and ex situ (XPS and ToF-SIMS) studies of the Nylon 6 and PMMA treated in remote O2 and O2-N2 plasmas. In J.V. Heberlein, D.W. Ernie, J. T. Roberts (ed.), Proceedings of the 12th International Symposium on Plasma Chemistry ISPC 12 (p. p. 185-190). Univ. of Minnesotan. https://hdl.handle.net/2078.5/220892