Internal stresses in ultrathin oxide films: influence on growth and reliability
(2013) 224th Meeting of the Electrochemical Society — Location: San Francisco, USA (27.October.2013)
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Van Overmeere, Q. (2013). Internal stresses in ultrathin oxide films: influence on growth and reliability. 224th Meeting of the Electrochemical Society, San Francisco, USA. https://hdl.handle.net/2078.5/202409