Bias-temperature phenomena in SOI structures and devices

Nazarov, A.N.;Barchuk, I.P.;Kilchytska, Valeriya
(1998) NATO Advanced Research Workshop on “Perspectives, Science and Technologies for Novel Silicon on Insulator Devices” — Location: Kiev (Ukraine) (12.October.1998)

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  • Nazarov, A.N.National Academy of Sciences of Ukraine
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  • Barchuk, I.P.National Academy of Sciences of Ukraine
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  • Kilchytska, ValeriyaUCLouvain
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Nazarov, A. N., Barchuk, I. P., & Kilchytska, V. (1998). Bias-temperature phenomena in SOI structures and devices. Proceedings of the NATO Advanced Research Workshop on “Perspectives, Science and Technologies for Novel Silicon on Insulator Devices”. Published. NATO Advanced Research Workshop on “Perspectives, Science and Technologies for Novel Silicon on Insulator Devices”, Kiev (Ukraine). https://hdl.handle.net/2078.5/253117