Fruit microstructure evaluation using synchrotron X-ray computed tomography

Verboven, Pieter;Kerckhofs, Greet;Mebatsion, Hibru Kelemu;Wevers, Martine;Nicolai, Bart;et.al.
(2008) ICEF — Location: Vina del Mar, Chili

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  • Verboven, Pieter
    Author
  • Kerckhofs, GreetUCLouvain
    Author
  • Mebatsion, Hibru Kelemu
    Author
  • Wevers, Martine
    Author
  • Nicolai, Bart
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  • KUL
  • KUL
  • KUL

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Verboven, P., Kerckhofs, G., Mebatsion, H. K., Wevers, M., Cloetens, P., & Nicolai, B. (2008). Fruit microstructure evaluation using synchrotron X-ray computed tomography. ICEF, Vina del Mar, Chili. https://hdl.handle.net/2078.5/236710