Interferometric sensitivity with Fourier based deflectometry

Antoine, Philippe
(2010) Conference on Advanced Phase Measurement Methods in Optics and Imaging — Location: Locarno, Switzerland

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  • Antoine, PhilippeUCLouvain
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Antoine, P. (2010). Interferometric sensitivity with Fourier based deflectometry. Conference on Advanced Phase Measurement Methods in Optics and Imaging, Locarno, Switzerland. https://hdl.handle.net/2078.5/222871