Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap

Reckinger, N.;Tang, Xiaohui;Dubois, E.;Godey, S.;Raskin, Jean-Pierre;et.al.
(2008) Journal of Applied Physics — Vol. 104, n° 10, p. 103523 (2008)

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Authors
  • Reckinger, N.
    Author
  • Tang, XiaohuiUCLouvain
    Author
  • Dubois, E.
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  • Godey, S.
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  • et. al.
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Citations

Reckinger, N., Tang, X., Dubois, E., Godey, S., Wallart, X., Raskin, J.-P., & et al. (2008). Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap. Journal of Applied Physics, 104(10), 103523. https://hdl.handle.net/2078.5/168289 (Original work published 2008)