Self-Heating Effect characterisation in SOI FinFETs
(2010) ULtimate Integration on Silicon - ULIS’10 — Location: Glasgow, Scotland (17.March.2010)
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Makovejev, S., Olsen, S., Dehan, M., & Raskin, J.-P. (2010). Self-Heating Effect characterisation in SOI FinFETs. Proceedings of the ULtimate Integration on Silicon - ULIS’10, pp. 9-12. https://hdl.handle.net/2078.5/231008