Joint use of X-ray photoelectron spectroscopy and analytical electron microscopy in the investigation of cobalt and nickel oxide supported on Na-doped alumina
Defossé, C.;Houalla, M.;Lycourgiotis, A.;Delannay, Francis
(1980) 6th Internat. Congress on Catalysis — Location: Tokyo (1980)
Defossé, C., Houalla, M., Lycourgiotis, A., & Delannay, F. (1980). Joint use of X-ray photoelectron spectroscopy and analytical electron microscopy in the investigation of cobalt and nickel oxide supported on Na-doped alumina. Proceedings 6th Internat. Congress on Catalysis, p. 108-121. https://hdl.handle.net/2078.5/228062