Atomic force microscopy from nanoscale imaging to holistic exploration

Alsteens, David;Meyer, Ernst;Müller, Daniel J.;Gerber, Christoph
(2026) Nature Reviews Physics — (2026)

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Authors
  • Alsteens, Davidorcid-logo
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  • Meyer, Ernst
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  • Müller, Daniel J.orcid-logo
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  • Gerber, Christoph
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Abstract
Forty years after its invention, atomic force microscopy has evolved from a simple surface imaging tool into one of the most versatile measurement platforms in nanoscience. This Comment traces the key innovations.
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Citations

Alsteens, D., Meyer, E., Müller, D. J., & Gerber, C. (2026). Atomic force microscopy from nanoscale imaging to holistic exploration. Nature Reviews Physics. Accepted/in-press. https://doi.org/10.1038/s42254-026-00956-3 (Original work published 2026)