Secondary Molecular Ion Emission From Aliphatic Polymers Bombarded With Low-energy Ions - Effects of the Molecular-structure and the Ion-beam-induced Surface Degradation

Delcorte, Arnaud;Weng, L.T.;Bertrand, Patrick
(1995) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 100, n° 2-3, p. 213-216 (1995)

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Abstract
The influence of the molecular structure on the secondary ion production is studied for three saturated aliphatic polymers (low-density polyethylene, polypropylene and polyisobutylene) bombarded with low energy ions. These polymers differ only by the presence and nature of the pendant group. The intensities of the most characteristic secondary molecular ions are followed as a function of the primary ion dose in the (10(12) ions/cm(2)-10(14) ions/cm(2)) range for two primary ion bombardment conditions (4 keV Xe+ and 15 keV Ga+). The results show that there is a direct relationship between the polymer degradation and the emission of molecular fragments. No truly ''static'' conditions are found, rather, the polymer surface undergoes a continuous transformation under ion beam bombardment. The most spectacular effect is its dehydrogenation. By rationalizing the competition between the two related processes, surface degradation and molecular ion production, a kinetic model is proposed in order to explain the behavior of molecular fragments belonging to the C8 cluster.
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Delcorte, A., Weng, L. T., & Bertrand, P. (1995). Secondary Molecular Ion Emission From Aliphatic Polymers Bombarded With Low-energy Ions - Effects of the Molecular-structure and the Ion-beam-induced Surface Degradation. Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 100(2-3), 213-216. https://hdl.handle.net/2078.5/35576 (Original work published 1995)