Time of flight secondary ion mass spectrometry (ToF-SIMS)
(1996) Microchimica Acta : an international journal on micro and trace analysis — Vol. 13, n° Suppl., p. 167-182 (1996)
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Bertrand, P., & Weng, L. T. (1996). Time of flight secondary ion mass spectrometry (ToF-SIMS). Microchimica Acta : an international journal on micro and trace analysis, 13(Suppl.), 167-182. https://hdl.handle.net/2078.5/71503 (Original work published 1996)