Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structuresKerckhofs, Greet;Pyka, Grzegorz;Braem, Annabel;Mattheys, Tina;Wevers, Martine;et.al.(2010) Cellular Materials (CellMat) 2010 — Location: Dresden, Germany (27.October.2010)
FilesManuscript_62_GreetKerckhofs.pdf Closed Access Adobe PDF451.98 KBRequest a copyDetailsAuthorsKerckhofs, GreetUCLouvainAuthorPyka, GrzegorzAuthorBraem, AnnabelAuthorMattheys, TinaAuthorWevers, MartineAuthorShow more AffiliationsKULKULShow moreCitations APA Chicago FWB Kerckhofs, G., Pyka, G., Braem, A., Mattheys, T., Schrooten, J., & Wevers, M. (2010). Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structures. Cellular Materials (CellMat) 2010, Dresden, Germany. https://hdl.handle.net/2078.5/236681