Characterization of 150 mu-m thick epitaxial silicon detectors from different producers after proton irradiation

Hoedlmoser, H., Moll, M., Kronberger, M., Trummer, J., Harkonen, J., & Rodeghiero, P. (2007). Characterization of 150 mu-m thick epitaxial silicon detectors from different producers after proton irradiation. Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, 580(3), 1243-1249. https://doi.org/10.1016/j.nima.2007.07.005 (Original work published 2007)