Fully polarimetric L-band brightness temperature signatures of azimuthal permittivity patterns - measurements and model simulations

Søbjærg, Sten Shmidl;Link, Moritz;Jagdhuber, Thomas;Montzka, Carsten;Meyer, Thomas;et.al.
(2018) IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2018) — Location: Valencia, Spain (22.July.2018)

Files

Jonard_Søbjærg_IGARSS2018.pdf
  • Open Access
  • Adobe PDF
  • 477.86 KB
Download

Details

Authors
  • Søbjærg, Sten ShmidlTechnical University of Denmark, Lyngby, Denmark
    Author
  • Link, MoritzGerman Aerospace Center, Wessling, Germany
    Author
  • Jagdhuber, ThomasGerman Aerospace Center, Wessling, Germany
    Author
  • Montzka, CarstenIBG-3, Forschungszentrum of Juelich, Germany
    Author
  • Jonard, Françoisorcid-logoUCLouvain
    Author
  • Meyer, ThomasIBG-3, Forschungszentrum of Juelich, Germany
    Author
Show more
Abstract
L-Band microwave radiometry over land mainly focuses on observations of horizontally (H) and vertically (V) polarized brightness temperatures. However, it has been demonstrated that measurements of the full Stokes vector [1] are sensitive to additional environmental properties, e.g. azimuthal plant row orientation. Furthermore, model simulations show that also a smooth surface with a periodic permittivity pattern can cause azimuthal dependencies of the Stokes parameters. The objective of this paper is to present fully polarimetric Lband measurement results from observations of a striped wood and styrodur target, when rotated 360° in small steps. Measurement results of a striped soil and open water target are also reported. Finally, measurements are compared to model simulations, with very good agreement within the validity range of the model (stripe thickness < λ/2).
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Søbjærg, S. S., Link, M., Jagdhuber, T., Montzka, C., Jonard, F., Dill, S., Peichl, M., & Meyer, T. (2018). Fully polarimetric L-band brightness temperature signatures of azimuthal permittivity patterns - measurements and model simulations. IEEE Xplore digital library (IEEE/IET Electronic Library), 6500-6503. https://doi.org/10.1109/IGARSS2018.8517302 (Original work published 2018)