Silicon isotopes as a new tracer to quantify superficial processes: the geological perspective

André, Luc;Cardinal, Damien;Opfergelt, Sophie
(2006) Geologica Belgica Conference, 2006 — Location: Liège (7.September.2006)

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André, L., Cardinal, D., & Opfergelt, S. (2006). Silicon isotopes as a new tracer to quantify superficial processes: the geological perspective. Geologica Belgica Conference, 2006, Liège. https://hdl.handle.net/2078.5/32199