Silicon isotopes as a new tracer to quantify superficial processes: the geological perspectiveAndré, Luc;Cardinal, Damien;Opfergelt, Sophie(2006) Geologica Belgica Conference, 2006 — Location: Liège (7.September.2006)
FilesNo attached file found for this publication.DetailsAuthorsAndré, LucMRACAuthorCardinal, DamienMRACAuthorOpfergelt, SophieUCLouvainAuthorAffiliationsMRACUCLouvainAGRO/MILA - Département des sciences du milieu et de l'aménagement du territoireShow moreCitations APA Chicago FWB André, L., Cardinal, D., & Opfergelt, S. (2006). Silicon isotopes as a new tracer to quantify superficial processes: the geological perspective. Geologica Belgica Conference, 2006, Liège. https://hdl.handle.net/2078.5/32199