TEM characterization of twinned nanocrystalline palladium freestanding thin films deformed using lab-on-chip technique
(2010) MRS Fall Meeting & Exhibit — Location: Boston, MA, USA (29.November.2010)
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Idrissi, H. (2010). TEM characterization of twinned nanocrystalline palladium freestanding thin films deformed using lab-on-chip technique. MRS Fall Meeting & Exhibit, Boston, MA, USA. https://hdl.handle.net/2078.5/126924