Why résistances to the European quality assurance devices are they discreet, hidden and rarely proud?

Croché, Sarah;Charlier, Jean-Emile
(2014) EERA-ECER Conference - The past, the present and the future of educational research in Europe — Location: Porto (2.September.2014)

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  • Croché, SarahUCLouvain
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  • Charlier, Jean-EmileUCLouvain
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Croché, S., & Charlier, J.-E. (2014). Why résistances to the European quality assurance devices are they discreet, hidden and rarely proud? EERA-ECER Conference - The past, the present and the future of educational research in Europe, Porto. https://hdl.handle.net/2078.5/49739