Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates
(2002) Philosophical Magazine Letters : structure and properties of condensed matter — Vol. 82, n° 9, p. 477-482 (2002)
Files
No attached file found for this publication.
Details
- Authors
- Abstract
- The evolution of buckling patterns of nickel thin films have been studied in situ by atomic force microscopy during cyclic tests composed of uniaxial compression followed by release of the external applied stress. After the first strain cycling, buckling structures evolve from straight-sided wrinkles to varicose patterns characterized by a debuckling of some parts of the film. Further cycling tests reveal that rebonding of the film on its substrate does not occur once decohesion has taken place.
- Affiliations
Citations
Cleymand, F., Coupeau, C., & Grilhe, J. (2002). Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates. Philosophical Magazine Letters : structure and properties of condensed matter, 82(9), 477-482. https://doi.org/10.1080/09500830210154688 (Original work published 2002)