On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties
(2012) Journées de la Matière Condensée - JMC13 — Location: Montpellier, France (27.August.2012)
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Vayrette, R., Coulombier, M., Bhaskar, U. K., Raskin, J.-P., & Pardoen, T. (2012). On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties. Proceedings des Journées de la Matière Condensée - JMC13, p. 479. https://hdl.handle.net/2078.5/230656