Application of secondary ion mass spectrometry to plasma treated polymer surface characterization in correlation with plasma characterizationLéonard, Didier(1996)
FilesLeonard.pdf Restricted Access Adobe PDF9.85 MBNo accessDetailsAuthorsLéonard, DidierUCLouvainauthorSupervisorsBertrand, PatrickAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésShow moreCitations APA Chicago FWB Léonard, D. (1996). Application of secondary ion mass spectrometry to plasma treated polymer surface characterization in correlation with plasma characterization. https://hdl.handle.net/2078.5/59508